SAE J784A_197108 PDF Download
$96.00
Residual Stress Measurement by X-Ray Diffraction
standard by SAE International, 08/01/1971
Document Format: PDF
Description
Product Details
- Published:
- 08/01/1971
- Number of Pages:
- 124
- File Size:
- 1 file , 8.9 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
