BS PD IEC TR 63258:2021 PDF Download
$151.00
Nanotechnologies. A guideline for ellipsometry application to evaluate the thickness of nanoscale films
standard by BSI Group, 03/26/2021
Document Format: PDF
Description
This document, which is a Technical Report, is focused on the practical protocol of ellipsometryto evaluate the thickness of nanoscale films. This document does not include any specificationof the ellipsometers, but suggests how to minimize the data variation to improve datareproducibility.
All current amendments available at time of purchase are included with the purchase of this document.
Product Details
- Published:
- 03/26/2021
- ISBN(s):
- 9780539009309, 9780539057102
- Number of Pages:
- 24
- File Size:
- 1 file , 1.1 MB
- Product Code(s):
- 30377346, 30377346, 30377346
- Note:
- This product is unavailable in Ukraine, Russia, Belarus