IEEE 1142-1995 PDF Download
$83.00IEEE Guide for the Design, Testing, and Application of Moisture-Impervious, Solid Dielectric, 5-35 kV Power Cable Using Metal-Plastic Laminates
standard by IEEE, 07/11/1995
Institute of Electrical and Electronics Engineers
IEEE is the world’s largest technical professional society, serving members in computing, electrical engineering and electronics. Comprised of 37 societies and councils, IEEE publishes technical journals, magazines, proceedings, and more than 800 standards.
IEEE Guide for the Design, Testing, and Application of Moisture-Impervious, Solid Dielectric, 5-35 kV Power Cable Using Metal-Plastic Laminates
standard by IEEE, 07/11/1995
IEEE Guide for the Selection, Testing, Application, and Installation of Cables having Radial-Moisture Barriers and/or Longitudinal Water Blocking
standard by IEEE, 03/26/2010
IEEE Guide on Shielding Practice for Low Voltage Cables
standard by IEEE, 04/13/1995
IEEE Guide on Shielding Practice for Low Voltage Cables
standard by IEEE, 03/04/2013
IEEE Recommended Practice for Sizing Nickel-Cadmium Batteries for Photovoltaic (PV) Systems
standard by IEEE, 02/28/1997
IEEE Recommended Practice for Installation and Maintenance of Nickel-Cadmium Batteries for Photovoltaic (PV) Systems
standard by IEEE, 11/27/1990
IEEE Recommended Practice for the Installation and Maintenance of Nickel-Cadmium Batteries for Photovoltaic (PV) Systems
standard by IEEE, 02/07/2000
IEEE Guide for the Rehabilitation of Hydroelectric Power Plants
standard by IEEE, 02/10/1992
IEEE Guide for the Rehabilitation of Hydroelectric Power Plants
standard by IEEE, 03/22/2006
IEEE Guide for the Rehabilitation of Hydroelectric Power Plants
standard by IEEE, 10/26/2021
IEEE Standard Test Access Port and Boundary-Scan Architecture
standard by IEEE, 05/21/1990
IEEE Standard Test Access Port and Boundary Scan Architecture
standard by IEEE, 07/23/2001
IEEE Standard for Test Access Port and Boundary-Scan Architecture
standard by IEEE, 05/13/2013
IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
standard by IEEE, 07/28/2017
IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)
Amendment by IEEE, 03/01/1995
IEEE Standard for a Mixed-Signal Test Bus
standard by IEEE, 03/20/2000
IEEE Standard for a Mixed-Signal Test Bus
standard by IEEE, 03/18/2011
IEEE Standard for Module Test and Maintenance Bus (MTM-Bus) Protocol
standard by IEEE, 01/24/1996
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
standard by IEEE, 04/17/2003
IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks
standard by IEEE, 03/18/2016