IEEE 1450-1999 PDF Download
$210.00
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
standard by IEEE, 09/01/1999
Document Format: PDF
Description
New IEEE Standard – Inactive-Reserved.Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
Product Details
- Published:
- 09/01/1999
- ISBN(s):
- 0738116467, 9780738116471
- Number of Pages:
- 140
- File Size:
- 1 file , 540 KB
- Product Code(s):
- STDRES94734
- Note:
- This product is unavailable in Russia, Belarus
