IEEE 660-1986 PDF Download
$32.00
IEEE Standard for Semiconductor Memory Test Pattern Language
standard by IEEE, 02/18/1986
Document Format: PDF
Description
New IEEE Standard – Inactive-Withdrawn.
Product Details
- Published:
- 02/18/1986
- ISBN(s):
- 9781504404129
- Number of Pages:
- 14
- File Size:
- 1 file , 3.3 MB
- Product Code(s):
- STDWD10413
- Note:
- This product is unavailable in Russia, Belarus