IEEE C62.59-2019 PDF Download
$38.00
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
standard by IEEE, 10/31/2019
Document Format: PDF
Description
New IEEE Standard – Active.Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators.
Product Details
- Published:
- 10/31/2019
- ISBN(s):
- 9781504462280, 9781504461191, 9781504461207
- Number of Pages:
- 40
- File Size:
- 1 file , 1.6 MB
- Product Code(s):
- STD23860, STDPD23860, STDPL23860
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
